Determining defects having a characteristic separation distance
US10805477B2 · kind B2 · utility
0Cited by
6References
12Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 20, 2017 |
| Grant date | Oct 13, 2020 |
| Priority date | — |
| Expiry date | Jan 20, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N1/00045
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
In an example, a method includes determining, by a processor, at least one separation distance between defects in a scanned image of a printed substrate sheet bearing a printed image, wherein the separation distance determined in a predetermined direction. The method may further comprise determining, by the processor, if the defects have a characteristic separation distance.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.