X-ray calibration standard object
US10807187B2 · kind B2 · utility
1Cited by
90References
12Claims
0Family size
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Key dates
| Filing date | Aug 24, 2016 |
| Grant date | Oct 20, 2020 |
| Priority date | — |
| Expiry date | Mar 1, 2039 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02P10/25
- WIPO fieldMaterials, metallurgy
- WIPO sectorChemistry
Abstract
An X-ray standard reference object for calibrating a scanning electron beam in an additive manufacturing apparatus by measuring X-ray signals generated by scanning the electron beam onto the reference object, the reference object comprises: a lower and an upper plate being essentially in parallel and attached spaced apart from each other, the upper plate comprises a plurality of holes, wherein a predetermined hollow pattern is provided inside the holes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.