Patent · US Active

Test element analysis system for the analytical examination of a sample

US10809245B2 · kind B2 · utility

0Cited by
3References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 7, 2017
Grant dateOct 20, 2020
Priority date
Expiry dateJun 20, 2038

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06K7/10861
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A test element analysis system for the analytical examination of a sample comprising: at least one evaluation device with at least one test element holder and at least one measuring device for measuring a change in a measuring zone of a test element; at least one barcode reader comprising at least one circuit board having a front side facing the barcode of the test element positioned in the test element holder and a reverse side facing away from the test element, wherein at least one electronic control element of the barcode reader is disposed on the circuit board and wherein the circuit board comprises at least one cavity penetrating the circuit board; at least one camera carrier element; and at least one camera electrically connected to the camera carrier element, with the camera carrier element and the camera being positioned such that the camera observes the barcode through the cavity.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.