Model-plant mismatch detection using model parameter data clustering for paper machines or other systems
US10809674B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 28, 2017 |
| Grant date | Oct 20, 2020 |
| Priority date | — |
| Expiry date | May 7, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B2219/25298
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
A method includes repeatedly identifying one or more values for one or more model parameters of at least one model associated with a process. The one or more values for the one or more model parameters are identified using data associated with the process. The method also includes clustering the values of the one or more model parameters into one or more clusters. The method further includes identifying one or more additional values for the one or more model parameters using additional data associated with the process. In addition, the method includes detecting a mismatch between the at least one model and the process in response to determining that at least some of the one or more additional values fall outside of the one or more clusters. The values could be clustered using a support vector machine.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.