Patent · US Active

Quantum circuit risk analysis

US10810665B2 · kind B2 · utility

4Cited by
0References
25Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 11, 2018
Grant dateOct 20, 2020
Priority date
Expiry dateJan 9, 2039

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06Q40/03
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

The technology described herein is directed towards quantum circuits used to analyze risk, including expected value, variance, value at risk and conditional value at risk metrics. Aspects can comprise modeling uncertainty of one or more random variables to provide a first quantum sub-circuit by mapping the one or more variables to quantum states represented by a selected number of qubits using quantum gates, and encoding a risk metric into a second quantum sub-circuit, the second quantum sub-circuit comprising a first ancilla qubit and Y-rotations controlled by one or more other qubits. Further aspects can comprise performing amplitude estimation based on the first sub-circuit and the second sub-circuit to extract a probability value corresponding to the risk metric, wherein the probability value represents a probability of measuring a one state in the ancilla qubit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.