Nondestructive testing of a component
US10810730B2 · kind B2 · utility
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13References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 18, 2013 |
| Grant date | Oct 20, 2020 |
| Priority date | — |
| Expiry date | Apr 11, 2038 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N23/23
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In some examples, a method for nondestructive testing of a component may include flashing the component using a flash lamp configured for flash thermography, collecting first image data regarding the component using an infrared camera, flowing a fluid through the component, and collecting second image data regarding the component using the infrared camera. A system for nondestructive testing of a component may include a single inspection station and a flash lamp configured for flash thermography, means for supplying a fluid to the component, and an infrared camera disposed at the inspection station.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.