Three-dimensional scanning system and scanning method thereof
US10810750B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 31, 2017 |
| Grant date | Oct 20, 2020 |
| Priority date | — |
| Expiry date | Mar 31, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/10028
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The disclosure relates to a three-dimensional scanning system, the system comprises: a light source, configured to alternately project multiple speckle patterns and fringe patterns on the tested object in sequence; left and right cameras, configured to synchronously acquire left and right speckle images and left and right fringe images of the tested object; a speckle data and mark point data reconstruction module, configured to obtain three-dimensional speckle data and three-dimensional mark point data according to the speckle images; a fringe matching module, configured to back project the three-dimensional speckle data and the three-dimensional mark point data onto the left and right fringe images and guide fringes of the left and right fringe images for matching; and a three-dimensional reconstruction module, configured to reconstruct corresponding fringes matched with the left and right fringe images into the three-dimensional fringe point cloud data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.