Patent · US Active

Method for manufacturing indium gallium nitride/gallium nitride quantum-well pyramid

US10811559B2 · kind B2 · utility

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3References
14Claims
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Key dates

Filing dateDec 26, 2018
Grant dateOct 20, 2020
Priority date
Expiry dateJan 1, 2039

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10H20/819
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method for manufacturing an indium gallium nitride/gallium nitride quantum-well pyramid is provided to improve upon the complexity of the conventional method for manufacturing light-emitting diode die. The method for manufacturing an indium gallium nitride/gallium nitride quantum-well pyramid includes performing a first epitaxial reaction and then a second epitaxial reaction on a substrate under 600-650° C. to form a gallium nitride pyramid, growing an first indium gallium nitride layer on an end face of the gallium nitride pyramid, where the end face is away from the substrate, and growing a first gallium nitride layer on the first indium gallium nitride layer. A flux ratio of nitrogen to gallium of the first epitaxial reaction is 25:1-35:1, and a flux ratio of nitrogen to gallium of the second epitaxial reaction is 130:1-150:1.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.