Arrangement unit, testing system and testing method
US10816593B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 26, 2018 |
| Grant date | Oct 27, 2020 |
| Priority date | — |
| Expiry date | Feb 2, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2834
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A testing system is suitable for receiving at least one testing item of multiple device under tests (DUTs). The testing system comprises a plurality of testing devices and an arrangement unit. The arrangement unit is coupled to the testing devices. The arrangement unit generates at least one testing instruction according to the at least one testing item and detects an idle state corresponding to the at least one testing instruction, and transmits the at least one testing instruction to the testing device in the idle state, so as to trigger the testing device in the idle state to test the corresponding DUT according to the at least one testing instruction and generate a testing result.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.