Apparatus and method for analyzing buildings
US10817630B2 · kind B2 · utility
1Cited by
2References
19Claims
0Family size
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Key dates
| Filing date | Nov 6, 2017 |
| Grant date | Oct 27, 2020 |
| Priority date | — |
| Expiry date | Nov 6, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F16/2465
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Disclosed herein are an apparatus and method for analyzing a building. The apparatus for analyzing a building includes a configuration unit for configuring analysis settings for analyzing a target building; a calculation unit for calculating a distance based on similarity by acquiring information about the target building and information about a standard building depending on the analysis settings and for generating a result of analysis of the target building using the distance; and an output unit for outputting the result of analysis of the target building.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.