Three-dimensional measurement apparatus and three-dimensional measurement method
US10818030B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 19, 2019 |
| Grant date | Oct 27, 2020 |
| Priority date | — |
| Expiry date | Mar 19, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30208
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A three-dimensional measurement apparatus includes: projecting means for projecting, onto a measurement target, patterned light having a two-dimensionally coded pattern in which a plurality of types of words each having a different two-dimensional structure and being distinguishable from each other are two-dimensionally arranged; capturing means for capturing the measurement target onto which the patterned light is projected; and calculating means for calculating a three-dimensional position of a target pixel of the image from an image captured by the capturing means, and the two-dimensionally coded pattern is two-fold symmetrical. The two-dimensionally coded pattern is a pattern in which a predetermined word is repeated in the column direction for each column.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.