Patent · US Active

Method and apparatus for the determination of the index of refraction of lens material

US10823636B2 · kind B2 · utility

0Cited by

0References

4Claims

0Family size

Assignee

ALCON INC. · CH

Inventors

Susanne Fechner · Aschaffenburg, DE
Roger Biel · Aschaffenburg, DE
Marcus Heift · Aschaffenburg, DE
Thomas Tonn · Aschaffenburg, DE

Key dates

Filing date	Dec 18, 2018
Grant date	Nov 3, 2020
Priority date	—
Expiry date	Apr 12, 2039

Classification

Technology area (CPC G)Physics
CPC primaryG02C7/04
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Method for determining the refractive index (n) of a material of a contact lens, in particular of a soft contact lens, the contact lens (1) having a first surface and a second surface defining a lens geometry there between, by measuring the wavefront issued by the contact lens (1) with a wavefront sensor (4), obtaining data of the geometry of at least one section of the contact lens (1) with an optical coherence tomography system (3) and communicating the geometry of the at least one section of the contact lens (1) from the optical coherence tomography system (3) to an analyzer, particularly a computer, and determining the refractive index (n) of the material of the contact lens from the geometry of the at least one section of the contact lens and from the wavefront issued by the contact lens (1).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.