Scanning type laser induced spectrum analysis and detection system

US10823679B2 · kind B2 · utility

Assignee

• THE ACADEMY OF OPTO-ELECTRONICS, CHINESE ACADEMY OF SCIENCES · CN

Inventors

• Tianzhuo Zhao · Beijing, CN
• Fuqiang Lian · Beijing, CN
• Zeqiang Mo · Beijing, CN
• Weiran Lin · Beijing, CN
• Yang Liu · Iowa City, US
• Shuzhen Nie · Beijing, CN
• Hong Xiao · Pleasanton, US
• Hongbo Zhang · Baofeng County, CN
• Zhongwei Fan · Beijing, CN

Key dates

• Filing date: Nov 24, 2016
• Grant date: Nov 3, 2020
• Expiry date: Nov 24, 2036

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N2201/105
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A scanning type laser induced spectrum surface range analysis and detection system includes a laser emitting head connected to an external laser inducing light source, which generates lasers emitted through the laser emitting head, so as to generate laser induced plasma. A focusing optical device converges induction excited laser beams emitted by the laser emitting head onto a surface of a tested sample. Then, a reflector collects wide spectral range induced plasma scattered light signals of the tested sample and converges the signals into a light collecting device. The light collecting device converges induced plasma scattered light into an optical fiber and transmits the induced plasma scattered light to an external spectrograph; and the external spectrograph divides a spectrum formed by the plasma to obtain spectral strength data of different wavelengths.