Patent · US Active

System, apparatus and method for accurate measurement of off-chip temperature

US10823693B2 · kind B2 · utility

0Cited by

0References

20Claims

0Family size

Assignee

Silicon Laboratories Inc. · US

Inventors

Euisoo Yoo · Austin, US
Thomas E. Voor · Cedar Park, US
John M. Khoury · New Providence, US

Key dates

Filing date	Jan 4, 2018
Grant date	Nov 3, 2020
Priority date	—
Expiry date	Dec 15, 2038

Classification

Technology area (CPC G)Physics
CPC primaryG01K2219/00
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

In an embodiment, an integrated circuit includes: a switched capacitor coupled between a supply voltage node and a divider node, where a thermistor external to the integrated circuit is to couple to the divider node; an analog-to-digital converter (ADC) coupled to the divider node to receive a voltage at the divider node and generate a digital value based thereon; and a controller coupled to the ADC to determine a temperature associated with the thermistor based at least in part on the digital value.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.