Projection system for measuring vibrations
US10824112B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Mar 19, 2018 |
| Grant date | Nov 3, 2020 |
| Priority date | — |
| Expiry date | Mar 19, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG03H2270/22
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
Some embodiments are directed to a system for measuring vibrations of a surface of a mechanical part, by digital holography. The system includes a source of radiation emitting in a predetermined range of frequencies, a first separator element configured to define a first incident ray and a reference ray, a module for shaping a second incident ray from the first incident ray, and an optical element configured to make the reference ray and a radiation produced by a reflection of the incident ray on the surface of the mechanical part interfere. The module for shaping the second incident ray includes diffracting optical elements having a diffraction structure to diffract the incident radiation. The structure is from a polymer, sol-gel or photoresin material resting against a glass substrate, the structure including elements etched in a plane parallel and/or orthogonal to the substrate, with dimensions from 100 nanometres to 100 micrometres.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.