Inclination measuring device
US10830587B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 27, 2017 |
| Grant date | Nov 10, 2020 |
| Priority date | — |
| Expiry date | Nov 29, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B2219/50032
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Provided is an inclination measuring device with excellent convenience.An inclination measuring device includes: an optical system (sensor head) configured to irradiate a measurement object with an irradiated light ray from a light source and receive a reflected light ray from a measurement surface; a light receiving unit including at least one spectroscope configured to separate the reflected light ray into wavelength components, and a detector in which a plurality of light receiving elements are disposed; a light guide including a plurality of cores; and a processor configured to calculate an inclination angle of the measurement surface based on reflected light rays with respect to a plurality of irradiated light rays with which a plurality of positions on the measurement surface are irradiated.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.