Optical and functional metrology of microstructured optical fibers
US10830667B1 · kind B1 · utility
1Cited by
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20Claims
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Key dates
| Filing date | May 16, 2019 |
| Grant date | Nov 10, 2020 |
| Priority date | — |
| Expiry date | May 16, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B6/02295
- WIPO fieldOther special machines
- WIPO sectorMechanical engineering
Abstract
Described are systems and techniques for characterizing optical fibers. Disclosed systems and techniques employ optical metrology, functional metrology, or both to characterize microstructured optical fibers and determine fiber characteristics, errors, and quality control metrics. The characteristics, errors, and quality control metrics are useful for improving the manufacturing of optical fibers.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.