X-ray inspection apparatus
US10830711B2 · kind B2 · utility
4Cited by
8References
20Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Mar 18, 2019 |
| Grant date | Nov 10, 2020 |
| Priority date | — |
| Expiry date | Mar 21, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V5/22
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An X-ray inspection apparatus includes: an X-ray emitter configured to emit an X-ray; an X-ray detector configured to detect the X-ray; a first flow passage configured to guide air to at least part of the X-ray detector; and a second flow passage configured to guide air to at least part of the X-ray detector.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.