Patent · US Active

Method, system and computer program for correcting a radiation pattern

US10830805B2 · kind B2 · utility

2Cited by

4References

18Claims

0Family size

Assignee

Rohde & Schwarz GmbH & Co. KG · DE

Inventors

Benoit Derat · Munich, DE
Gerhard Hamberger · Munich, DE

Key dates

Filing date	Nov 19, 2018
Grant date	Nov 10, 2020
Priority date	—
Expiry date	Mar 1, 2039

Classification

Technology area (CPC G)Physics
CPC primaryG01R29/105
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method for correcting a radiation pattern is described by using a system having a device under test with at least one antenna and a measurement antenna. The device under test is located in a placement zone. A radiation pattern of the device under test is measured. A corrected measurement antenna pattern is determined to compensate for an offset of the at least one antenna of the device under test with respect to a coordinate center of the placement zone towards which the measurement antenna is orientated. The corrected measurement antenna pattern is applied on the measured radiation pattern of the device under test to obtain a corrected radiation pattern of the device under test. Furthermore, a system and a computer program for correcting a radiation pattern are described.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.