Patent · US Active

Distributed analysis X-ray inspection methods and systems

US10830920B2 · kind B2 · utility

4Cited by
689References
30Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 8, 2019
Grant dateNov 10, 2020
Priority date
Expiry dateNov 8, 2039

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2207/30248
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The present specification discloses systems and methods for integrating manifest data for cargo and light vehicles with their X-ray images generated during scanning. Manifest data is automatically imported into the system for each shipment, and helps the security personnel to quickly determine the contents of cargo. In case of a mismatch between cargo contents shown by manifest data and the X-ray images, the cargo may be withheld for further inspection. In one embodiment, the process of analyzing the X-ray image of the cargo in conjunction with the manifest data is automated.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.