Optical measurement method and device
US10831010B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Mar 18, 2019 |
| Grant date | Nov 10, 2020 |
| Priority date | — |
| Expiry date | Mar 18, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/12
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An optical measurement method and an optical measurement device for determining the spatial or spatiotemporal distribution of a sample, the sample comprising at least one retransmission source retransmitting light depending on light projected onto the sample according to a predetermined law. The method has steps of projection onto the sample of at least two compact light distributions belonging to different topological families, which propagate along the same optical path; detection of the light retransmitted by said at least one retransmission source of the sample; generation of at least one optical image from the detected light; and algorithmic analysis of the optical images for obtaining location data on said at least one retransmission source.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.