Patent · US Active

Sample holder for image based analysis of samples

US10831011B2 · kind B2 · utility

0Cited by

4References

23Claims

0Family size

Assignee

Q-LINEA AB · SE

Inventors

Jonas Jarvius · Uppsala, SE
Jan Grawe · Uppsala, SE

Key dates

Filing date	Jun 15, 2017
Grant date	Nov 10, 2020
Priority date	—
Expiry date	Jun 15, 2037

Classification

Technology area (CPC G)Physics
CPC primaryG01N2021/6482
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A sample holder 100 for use in a device for image-based analysis of multiple samples, the sample holder comprising: an optically flat surface 10; multiple locations of interest 16, 18 dispersed across the optically flat surface 10 that each, in use, correspond to locations of a sample of the multiple samples; and multiple focal structures 12 associated with the multiple locations of interest 16, 18; wherein the focal structures 12 each comprise at least one pyramid shaped indentation 30 in the optically flat surface 10.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.