Debug data recovery after PLI event
US10831657B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 30, 2018 |
| Grant date | Nov 10, 2020 |
| Priority date | — |
| Expiry date | Jan 31, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2212/7203
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present disclosure generally relates to a storage device sensing critical failure or PLI events and writing the debug data to a memory device so that when boot-up occurs, at least some debug data is available. A dedicated hardware unit detects when one or more critical failure conditions occur by monitoring the one or more critical failure conditions. The critical failure conditions being detected or sensed triggers the dedicated hardware unit to automatically write debug data stored in a volatile memory device to a non-volatile memory device. The debug data stored in the non-volatile memory device provides a critical failure or PLI trace to determine what occurred leading up to and during a critical failure event. By writing the debug data to the non-volatile memory device, the critical failure trace may be accessed and analyzed after the device powers down or fails.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.