System and method for data visualization using machine learning and automatic insight of outliers associated with a set of data
US10832171B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 1, 2018 |
| Grant date | Nov 10, 2020 |
| Priority date | — |
| Expiry date | Oct 1, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2200/24
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In accordance with various embodiments, described herein are systems and methods for use of computer-implemented machine learning to automatically determine insights of facts, segments, outliers, or other information associated with a set of data, for use in generating visualizations of the data. In accordance with an embodiment, the system can use a machine learning process to automatically determine one or more outliers or findings within the data, based on, for example, determining a plurality of combinations representing pairs of attribute dimensions within a data set, from which a general explanation or pattern can be determined for one or more attributes, and then comparing particular values for attributes, with the determined pattern for those attributes. Information describing such outliers or findings can be graphically displayed at a user interface, as text, graphs, charts, or other types of visualizations, and used as a starting point for further analysis of the data set.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.