Optical geometry calibration devices, systems, and related methods for three dimensional x-ray imaging
US10835199B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 1, 2017 |
| Grant date | Nov 17, 2020 |
| Priority date | — |
| Expiry date | Jun 5, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/303
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Optical geometry calibration devices, systems, and related methods for x-ray imaging are disclosed. An optical-based geometry calibration device is configured to interface with a two-dimensional (2D) imaging device to perform three-dimensional (3D) imaging. The optical-based geometry calibration device includes one or more optical cameras fixed to either an x-ray source or an x-ray detector, one or more markers fixed to the x-ray detector or the x-ray source, with each of the one or more optical cameras being configured to capture at least one photographic image of one or more corresponding optical markers when each x-ray image of the object is captured, and an image processing system configured to compute positions of the x-ray source relative to the x-ray detector for each 2D projection image based on the at least one photographic image of the one or more markers.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.