Additively manufactured radiological test patterns
US10838090B1 · kind B1 · utility
0Cited by
12References
27Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Aug 10, 2018 |
| Grant date | Nov 17, 2020 |
| Priority date | — |
| Expiry date | Aug 10, 2038 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB29L2031/753
- WIPO fieldOther special machines
- WIPO sectorMechanical engineering
Abstract
A radiological evaluation device and a method of constructing a radiological evaluation device include a first high-Z material. A first test pattern is constructed by extruding a first high-Z material according to a first test pattern design file. The first high-Z material is combined with a second material to construct the first test pattern. The first high-Z material is radiologically distinct from the second material. A phantom body is constructed. The first test pattern is secured to the phantom body.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.