Patent · US Active

Automatic detection of clock grid misalignments and automatic realignment

US10838449B2 · kind B2 · utility

0Cited by

16References

20Claims

0Family size

Assignee

International Business Machines Corporation · US

Inventors

Benedikt Geukes · Stuttgart, DE
Matteo Michel · Chemnitz, DE
Manfred Walz · Pfalzgrafenweiler, DE

Key dates

Filing date	Jul 5, 2018
Grant date	Nov 17, 2020
Priority date	—
Expiry date	Nov 13, 2038

Classification

Technology area (CPC G)Physics
CPC primaryG06F1/12
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

Automatic detection of clock grid misalignments and automatic realignment including loading a test pattern into a first storage element on a first clock grid on a circuit; scanning the test pattern from the first storage element on the first clock grid to a second storage element on a second clock grid on the circuit; reading the scanned test pattern from the second storage element on the second clock grid; evaluating the scanned test pattern for errors; and in response to detecting an error in the scanned test pattern, triggering an alignment of the first clock grid and the second clock grid.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.