Patent · US Active

Machine learning a feature detector using synthetic training data

US10839262B2 · kind B2 · utility

1Cited by

3References

20Claims

0Family size

Assignee

HERE GLOBAL B.V. · NL

Inventors

Brad Keserich · Eindhoven, NL
Stephen O'Hara · Chicago, US
Nicholas Dronen · Eindhoven, NL

Key dates

Filing date	Apr 24, 2018
Grant date	Nov 17, 2020
Priority date	—
Expiry date	Oct 30, 2038

Classification

Technology area (CPC G)Physics
CPC primaryG06T17/20
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

Synthetic training information/data of a second probe style is generated based on first probe information/data of a first probe style using a style transfer model. First probe information/data is defined. An instance of first probe information/data comprises labels and first probe style sensor information/data. A style transfer model generates training information/data based on at least a portion of the first probe information/data. An instance of training information/data corresponds to an instance of first probe information/data and comprises second probe style sensor information/data. The first and second probe styles are different. A second probe style model is trained using machine learning and the training information/data. The second probe style model is used to analyze second probe style second probe information/data to extract map information/data from the second probe information/data. Each instance of second probe data is captured by one or more second probe sensors of a second probe apparatus.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.