User interface for managing defects

US10839504B2 · kind B2 · utility

Assignee

• Palantir Technologies Inc. · US

Inventors

• Alexander Taheri · New York, US
• Alexandru Antihi · Leatherhead, GB
• Arion Sprague · San Francisco, US
• Benjamin Grabham · London, GB
• Benjamin Lee · Palo Alto, US
• Gregoire Omont · London, GB
• Jim Inoue · Kirkland, US
• Michael Yang · New York, US
• Myles Scolnick · New York, US
• Pierre Lucotte · Paris, FR
• Ryan Rowe · San Francisco, US
• Tarik Benabdallah · Paris, FR
• Thomas Powell · San Francisco, US

Key dates

• Filing date: Mar 8, 2019
• Grant date: Nov 17, 2020
• Expiry date: Mar 10, 2039

Classification

• Technology area (CPC G): Physics
• CPC primary: G06F3/0482
• WIPO field: Computer technology
• WIPO sector: Electrical engineering

Abstract

User interfaces for managing defects are provided. A defect selection interface may include a set of defect items for selection by a user. The defect selection interface may include one or more first visuals indicating similarity of the set of defect items to other defect items. An issue selection interface may include a set of issue items for selection by the user. Individual issue items may include one or more defect items added to the individual issue items. A defect comparison interface may include a comparison of a defect item to an issue item. The defect comparison interface may include one or more second visuals indicating similarity of the defect item to the issue item. Based on the user's selection, the defect item may be added to the issue item.