Droplet deposition apparatus and test circuit therefor
US10843459B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 29, 2017 |
| Grant date | Nov 24, 2020 |
| Priority date | — |
| Expiry date | Jun 29, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2829
- WIPO fieldTextile and paper machines
- WIPO sectorMechanical engineering
Abstract
A test circuit to determine the capacitance of an actuator element in an actuator element array, wherein the test circuit comprises: a controller; a source to generate test inputs; measurement circuitry to measure one or more test values on a test path between the test circuit and the actuator element; wherein the controller is configured to, for a test period: control a first switch associated with the actuator element to connect the actuator element to the test path; control the source to generate a first test input; and determine a total capacitance of the actuator element from a first test value generated in response to the first test input; and determine the capacitance of the actuator element (CACT) from the total capacitance (CPAR+CACT).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.