Holographic method for characterizing a particle in a sample
US10845286B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Mar 22, 2017 |
| Grant date | Nov 24, 2020 |
| Priority date | — |
| Expiry date | Jun 14, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG03H2001/0883
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for holographic characterization of a particle contained in a sample, based on an image, or hologram, of the sample obtained by an image sensor when the sample is illuminated by a light source. The hologram is the subject of a holographic reconstruction, to obtain a reference complex image, representative of the light wave transmitted by the sample in a reconstruction plane. A holographic propagation operator is applied to the reference complex image, to obtain a plurality of secondary complex images, from which a profile is determined describing the change in an optical feature of the light wave transmuted by the sample along the axis of propagation of the light wave.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.