Integrated circuit intended for insulation defect detection and having a conductive armature
US10845405B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Dec 15, 2016 |
| Grant date | Nov 24, 2020 |
| Priority date | — |
| Expiry date | Jan 7, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05B45/54
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An electronic circuit including: an electronic component, a conductive armature surrounding the electronic component, an electrical insulator between the electronic component and the conductive armature, a device configured to measure current passing through the armature or voltage on the armature or on the electronic component, and a defect determination device configured to determine a defect in the electrical insulator based on the measured current or voltage.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.