Patent · US Active

Integrated circuit intended for insulation defect detection and having a conductive armature

US10845405B2 · kind B2 · utility

0Cited by
0References
13Claims
0Family size

Assignee

Inventor

Key dates

Filing dateDec 15, 2016
Grant dateNov 24, 2020
Priority date
Expiry dateJan 7, 2037

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH05B45/54
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An electronic circuit including: an electronic component, a conductive armature surrounding the electronic component, an electrical insulator between the electronic component and the conductive armature, a device configured to measure current passing through the armature or voltage on the armature or on the electronic component, and a defect determination device configured to determine a defect in the electrical insulator based on the measured current or voltage.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.