Patent · US Active

Calibration and monitoring for 3-axis magnetometer arrays of arbitrary geometry

US10845432B2 · kind B2 · utility

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11References
18Claims
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Key dates

Filing dateJun 30, 2017
Grant dateNov 24, 2020
Priority date
Expiry dateJun 30, 2037

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N27/82
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A system and method for calibrating rigid and non-rigid arrays of 3-axis magnetometers. Such arrays might be used to analyze structures containing ferromagnetic material. The calibration determines scale factor and bias parameters of each magnetometer in the array, and the relative orientation and position of each magnetometer in the array. Once the parameters are determined, the actual magnetic field value at the magnetometer location can be simply related to magnetometer measurements. The method and system can be used to calibrate an array of 3-axis magnetometers in aggregate as opposed to individual magnetometers. This is critical in large arrays to increasing reproducibility of the calibration procedure and decreasing time required to complete calibration procedure.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.