Patent · US Active

Identifying linear defects

US10845746B2 · kind B2 · utility

0Cited by

2References

18Claims

0Family size

Assignee

HP INDIGO B.V. · NL

Inventors

Oren Haik · Nes Ziona, IL
Oded Perry · Nes Ziona, IL
Avi Malki · Nes Ziona, IL

Key dates

Filing date	Jan 20, 2017
Grant date	Nov 24, 2020
Priority date	—
Expiry date	Jan 20, 2037

Classification

Technology area (CPC G)Physics
CPC primaryG03G15/5062
WIPO fieldOptics
WIPO sectorInstruments

Abstract

In an example, a method includes determining, by a processor, a cumulative indication of defects present in linear sub-portions located in a common position of each of a plurality of substrate sheets bearing a printed image. The method may further comprise identifying, by the processor, a linear defect based on the cumulative indication of defects.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.