Functional safety over trace-and-debug

US10846439B2 · kind B2 · utility

Assignee

• Intel Corporation · US

Inventors

• Riccardo Locatelli · Santa Clara, US
• Peter Lachner · Heroldstatt, DE
• Riccardo Mariani · Pisa, IT
• Michael Paulitsch · Columbia Heights, US
• Kevin Safford · Fort Collins, US

Key dates

• Filing date: Jun 28, 2019
• Grant date: Nov 24, 2020
• Expiry date: Jun 28, 2039

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/319
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A system to evaluate functional safety in an integrated circuit. The system includes a first circuit to execute an operation to cause to system to perform a function, where the function associated with a specified safety integrity level. The system also includes second circuit to capture trace data at an interface to the first circuit or at internal signals without inhibiting performance of the function, where the trace data comprising information that is used to determine whether the system can perform the function with an indicated level of functional safety and transmit the trace data to a safety evaluation circuit.