Integrated circuits for generating input/output latency performance metrics using real-time clock (RTC) read measurement module
US10853283B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 19, 2019 |
| Grant date | Dec 1, 2020 |
| Priority date | — |
| Expiry date | Jun 19, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2213/0026
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An integrated circuit includes technology for generating input/output (I/O) latency metrics. The integrated circuit includes a real-time clock (RTC), a read measurement register, and a read latency measurement module. The read latency measurement module includes control logic to perform operations comprising (a) in response to receipt of read responses that complete read requests associated with an I/O device, automatically calculating read latencies for the completed read requests, based at least in part on time measurements from the RTC for initiation and completion of the read requests; (b) automatically calculating an average read latency for the completed read requests, based at least in part on the calculated read latencies for the completed read requests; and (c) automatically updating the read measurement register to record the average read latency for the completed read requests. Other embodiments are described and claimed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.