Patent · US Active

Method and system to separate optically measured coupled parameters

US10854932B2 · kind B2 · utility

1Cited by

3References

14Claims

0Family size

Assignee

Palo Alto Research Center Incorporated · US

Inventors

Anurag Ganguli · Saratoga, US
Julian Schwartz · Palo Alto, US
Ajay Raghavan · Mountain View, US
Peter Kiesel · Palo Alto, US
Bhaskar Saha · Redwood City, US
Saroj Kumar Sahu · Tracy, US
Lars Wilko Sommer · Bretten, DE

Key dates

Filing date	Jul 28, 2015
Grant date	Dec 1, 2020
Priority date	—
Expiry date	May 17, 2038

Classification

Technology area (CPC H)Electricity
CPC primaryH01M10/425
WIPO fieldElectrical machinery, apparatus, energy
WIPO sectorElectrical engineering

Abstract

A system includes a first optical sensor sensitive to both a parameter of interest, Parameter1, and at least one confounding parameter, Parameter2 and a second optical sensor sensitive only to the confounding parameter. Measurement circuitry measures M1 in response to light scattered by the first optical sensor, where M1=value of Parameter1+K*value of Parameter2. The measurement circuitry also measures M2 in response to light scattered by the second optical sensor, where M2=value of Parameter2. Compensation circuitry determines a compensation factor, K, for the confounding parameter based on measurements of M1 and M2 taken over multiple load/unload cycles or over one or more thermal cycles. The compensation factor is used to determine the parameter of interest.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.