System and method for monitoring of objects with increased sensitivity
US10856739B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 21, 2017 |
| Grant date | Dec 8, 2020 |
| Priority date | — |
| Expiry date | Nov 21, 2037 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B5/1455
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A system for monitoring parameters of an object is described. The system comprising: a monitoring unit configured for performing one or more monitoring sessions on an object and collecting data from an inspection region on the object over time and generating monitored data indicative of the inspected region, a stimulation unit configured and operable for applying at least one selected external stimulation field on the object during said one or more monitoring sessions, and a control unit configured for receiving the monitored data from the monitoring unit and determining one or more selected parameters. The stimulation unit is configured for providing said at least one selected external stimulation field directed toward said inspection region from two or more different directions. The control unit being configured for utilizing said monitored data in accordance with data on the two or more different directions of the stimulation field applied to the inspection region for determining one or more selected parameters of the object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.