Patent · US Active

Trapezoidal CMP groove pattern

US10857648B2 · kind B2 · utility

0Cited by
44References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 5, 2017
Grant dateDec 8, 2020
Priority date
Expiry dateOct 5, 2037

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/30625
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

The polishing pad is suitable for polishing or planarizing a wafer of at least one of semiconductor, optical and magnetic substrates. The polishing pad includes a polishing layer having a polymeric matrix and radial feeder grooves in the polishing layer separating the polishing layer into polishing regions. The radial feeder grooves extend at least from a location adjacent the center to a location adjacent the outer edge of the polishing pad. Each polishing region includes a series of spaced non-isosceles trapezoid groove structures having parallel base segments connecting two adjacent radial feeder grooves to form leg segments. The series of non-isosceles trapezoid groove structures extend from adjacent the outer edge toward the center of the polishing pad with the perimeter of the series of trapezoid structures also being a trapezoid.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.