Method and system for spectral characterization in computed tomography x-ray microscopy system
US10859515B2 · kind B2 · utility
3Cited by
6References
19Claims
0Family size
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Key dates
| Filing date | Mar 22, 2017 |
| Grant date | Dec 8, 2020 |
| Priority date | — |
| Expiry date | Mar 3, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/419
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A spectrum measurement and estimation method for tomographic reconstruction, beam hardening correction, dual-energy CT and system diagnosis, etc., comprises determining the spectra for combinations of source acceleration voltage, pre-filters and/or detectors and after measuring the transmission values of several pre-filters, calculating corrected spectra for the combinations of the source acceleration voltage, pre-filters and/or detectors.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.