Power droop measurements using analog-to-digital converter during testing
US10859628B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 4, 2019 |
| Grant date | Dec 8, 2020 |
| Priority date | — |
| Expiry date | Jun 7, 2039 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/1205
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus includes a functional circuit, including a power supply node, and a test circuit. The functional circuit is configured to operate in a test mode that includes generating respective test output patterns in response to application of a plurality of test stimulus patterns. The test circuit is configured to identify a particular test stimulus pattern of the plurality of test stimulus patterns, and to reapply the particular test stimulus pattern to the functional circuit multiple times. The test circuit is further configured to vary, for each reapplication, a start time of the particular test stimulus pattern in relation to when a voltage level of the power supply node is sampled for that reapplication.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.