Intelligent monitoring and diagnostics for application support
US10860400B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 31, 2018 |
| Grant date | Dec 8, 2020 |
| Priority date | — |
| Expiry date | Jan 18, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2201/865
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method is used in monitoring an application in a computing environment. The method represents execution of the application on a system as a finite state machine. The finite state machine depicts at least one state of the application, where the state indicates at least one of successful application execution and unsuccessful application execution. The method identifies an error state within the finite state machine, where the error state indicates the unsuccessful application execution. The method identifies, by analyzing the finite state machine, a non-error state as a cause of the unsuccessful application execution, where the unsuccessful application execution is represented as a path comprising a plurality of states, where the path comprises the non-error state. The method maps the non-error state to a location in the application to identify the cause of the unsuccessful application execution.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.