Test data management
US10860616B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 6, 2016 |
| Grant date | Dec 8, 2020 |
| Priority date | — |
| Expiry date | Jul 28, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F16/2365
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
As disclosed herein, a method includes receiving a plurality of datasets from a database, wherein each dataset comprises one or more data fields represented in a single data format, and wherein the data fields from at least two of the datasets are represented in different data formats, combining the plurality of datasets to provide a created data column corresponding to all of the data fields from the plurality of datasets, organizing the data column into data clusters, wherein each data cluster includes data fields represented in a single data format, and wherein each data field belongs to a data cluster, providing a key-value map referencing data fields with respect to their corresponding data formats, and verifying the database with respect to the created column. A corresponding computer program product and computer system are also disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.