Learning-based correction of grid artifacts in X-ray imaging

US10861155B2 · kind B2 · utility

Assignee

• Siemens Healthcare Limited · DE

Inventors

• Philipp Bernhardt · Forchheim, DE
• Boris Stowasser · Erlangen, DE

Key dates

• Filing date: Feb 8, 2020
• Grant date: Dec 8, 2020
• Expiry date: Feb 8, 2040

Classification

• Technology area (CPC G): Physics
• CPC primary: G06T2207/20081
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A method for training a function of an X-ray system that has a positioning mechanism such as a C-arm, a detector, and, in a beam path in front of the detector, an anti-scatter grid. Positioning of the detector at a large number of different positions occurs. The positioning mechanism is deflected and/or distorted. Recording of at least one X-ray photograph in each of the positions then takes place, and the method further includes machine learning of artifacts generated by the anti-scatter grid from all X-ray photographs for the function.