Patent · US Active

In-situ HIC growth monitoring probe

US10866183B2 · kind B2 · utility

3Cited by
12References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 25, 2018
Grant dateDec 15, 2020
Priority date
Expiry dateDec 27, 2038

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N33/2025
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The present application concerns in-situ intrusive probe systems and methods. The probe systems described herein can be installed flush to a hydrocarbon containing structure, such as a pipeline, vessel, or other piping system carrying crude, gas or sour products. The probe systems include hydrogen induced cracking (HIC)-resistant microstructure such that as atomic hydrogen permeates the probe surface, the probe captures recombined hydrogen gas. The pressure of the resultant hydrogen gas buildup is measured and predictions as to the HIC activity of that area can be made.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.