In-situ HIC growth monitoring probe
US10866183B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 25, 2018 |
| Grant date | Dec 15, 2020 |
| Priority date | — |
| Expiry date | Dec 27, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N33/2025
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present application concerns in-situ intrusive probe systems and methods. The probe systems described herein can be installed flush to a hydrocarbon containing structure, such as a pipeline, vessel, or other piping system carrying crude, gas or sour products. The probe systems include hydrogen induced cracking (HIC)-resistant microstructure such that as atomic hydrogen permeates the probe surface, the probe captures recombined hydrogen gas. The pressure of the resultant hydrogen gas buildup is measured and predictions as to the HIC activity of that area can be made.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.