Correcting pixel defects based on defect history in an image processing pipeline
US10868985B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 4, 2019 |
| Grant date | Dec 15, 2020 |
| Priority date | — |
| Expiry date | Oct 4, 2039 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N25/683
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
An image signal processor may include a pixel defect correction component that tracks defect history for frames captured by an image sensor and applies the history when identifying and correcting defective pixels in a frame. The component maintains a defect pixel location table that includes a defect confidence value for pixels of the image sensor. The component identifies defective pixels in a frame, for example by comparing each pixel's value to the values of its neighbor pixels. If a pixel is detected as defective, its defect confidence value may be incremented. Otherwise, the value may be decremented. If a pixel's defect confidence value is over a defect confidence threshold, the pixel is considered defective and thus may be corrected. If a pixel's defect confidence value is under the threshold, the pixel is considered not defective and thus may not be corrected even if the pixel was detected as defective.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.