Patent · US Active

Non-contact material inspection

US10871468B2 · kind B2 · utility

1Cited by
2References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 5, 2019
Grant dateDec 22, 2020
Priority date
Expiry dateMay 8, 2039

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01S13/88
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

This disclosure relates to non-contact inspection of material for identifying and estimate composition of a material under inspection. Traditionally, material inspection is an invasive process involving contact based approaches. A radar-based approach requires placement of the radar at a specific location, which is a challenge since amplitude of the reflected signal, depends on the distance from the material under inspection. The present disclosure addresses this technical problem by providing a Continuous Wave radar-based approach that is based on absolute slope at extrema points on the reflected signal from the material under inspection.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.