Patent · US Active

Jitter decomposition method and measurement instrument

US10873517B2 · kind B2 · utility

0Cited by
2References
29Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 23, 2020
Grant dateDec 22, 2020
Priority date
Expiry dateJan 23, 2040

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH04L43/50
  • WIPO fieldDigital communication
  • WIPO sectorElectrical engineering

Abstract

A jitter decomposition method for decomposing several jitter and noise components contained in an input signal, wherein the input signal is generated by a signal source, is disclosed. The jitter decomposition method comprises: receiving the input signal; at least one of determining and receiving a reconstructed data dependent jitter signal; at least one of determining and receiving an impulse response, the impulse response being associated with at least the signal source; and determining at least a first statistical parameter being associated with a first jitter component or a first noise component in the input signal and a second statistical parameter being associated with a second jitter component or a second noise component in the input signal, the second jitter component or the second noise component being different from the first jitter component or the first noise component, respectively. The first statistical parameter and the second statistical parameter are determined by applying a statistical method at two different times, wherein the first statistical parameter and the second statistical parameter are each determined based on at least one of the reconstructed data depend…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.