Jitter decomposition method and measurement instrument
US10873517B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 23, 2020 |
| Grant date | Dec 22, 2020 |
| Priority date | — |
| Expiry date | Jan 23, 2040 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L43/50
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
A jitter decomposition method for decomposing several jitter and noise components contained in an input signal, wherein the input signal is generated by a signal source, is disclosed. The jitter decomposition method comprises: receiving the input signal; at least one of determining and receiving a reconstructed data dependent jitter signal; at least one of determining and receiving an impulse response, the impulse response being associated with at least the signal source; and determining at least a first statistical parameter being associated with a first jitter component or a first noise component in the input signal and a second statistical parameter being associated with a second jitter component or a second noise component in the input signal, the second jitter component or the second noise component being different from the first jitter component or the first noise component, respectively. The first statistical parameter and the second statistical parameter are determined by applying a statistical method at two different times, wherein the first statistical parameter and the second statistical parameter are each determined based on at least one of the reconstructed data depend…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.