Passive millimeter wave radiometer system for calibration of infrared cameras
US10876898B2 · kind B2 · utility
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13References
20Claims
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Key dates
| Filing date | Aug 8, 2018 |
| Grant date | Dec 29, 2020 |
| Priority date | — |
| Expiry date | Jul 4, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2005/0077
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for accurate measurement of surface and sub-surface temperatures of an object from a distance without contacting the object is provided. Illustrative embodiments provide for simultaneous measurement of thermal emission and emissivity in the mm-wave regime thereby enabling real-time non-contact measurement of emissivity. Corrected temperatures for the object which may be used for calibration of infrared thermographic cameras are determined from the measurement of emissivity.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.