Wavefront based characterization of lens surfaces based on reflections
US10876924B2 · kind B2 · utility
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11References
20Claims
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Key dates
| Filing date | Feb 8, 2019 |
| Grant date | Dec 29, 2020 |
| Priority date | — |
| Expiry date | Feb 8, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/9583
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A wavefront based characterization of surfaces based on reflections. An intraocular lens surface measurement system includes a light source configured to emit light that is reflected off an optical surface of an intraocular lens. A wavefront sensor is configured to receive the light that is reflected off the optical surface of the intraocular lens. A processor is configured to determine one or more characteristics of the optical surface of the intraocular lens based on a wavefront of the reflected light that is received by the wavefront sensor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.